Effects of total ionizing dose on single event effect sensitivity of FRAMs

array(2) { ["lab"]=> string(4) "1176" ["publication"]=> string(4) "9759" } Effects of total ionizing dose on single event effect sensitivity of FRAMs - 单粒子效应研究组 | LabXing

单粒子效应研究组

简介

关注

2019

期刊 Microelectronics Reliability

作者 Qinggang Ji · Jie Liu · Dongqing Li · Tianqi Liu · Bing Ye · Peixiong Zhao · Youmei Sun

下载全文

卷 95
页码 1-7
Elsevier BV
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2019.02.010

LabXing 上可以免费创建课题组网站