Characterization of electrode surface roughness and its impact on ion trap mass analysis - 谱学仪器实验室 | LabXing

array(2) { ["lab"]=> string(4) "1220" ["publication"]=> string(5) "10108" } Characterization of electrode surface roughness and its impact on ion trap mass analysis - 谱学仪器实验室 | LabXing

谱学仪器实验室

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Characterization of electrode surface roughness and its impact on ion trap mass analysis

2009

期刊 Journal of Mass Spectrometry

作者 Wei Xu · William J. Chappell · R. Graham Cooks · Zheng Ouyang

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卷 44
期 3
页码 353-360
Wiley
ISSN: 1076-5174
DOI: 10.1002/jms.1512

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