Electron mobility in silicon nanowires using nonlinear surface roughness scattering model - 铁电器件课题组（王晓磊） | LabXing

array(2) { ["lab"]=> string(4) "1352" ["publication"]=> string(5) "11886" } Electron mobility in silicon nanowires using nonlinear surface roughness scattering model - 铁电器件课题组（王晓磊） | LabXing

铁电器件课题组（王晓磊）

简介半导体存储器件

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Electron mobility in silicon nanowires using nonlinear surface roughness scattering model

2020

期刊 Japanese Journal of Applied Physics

作者 Jiahui Duan · Jinjuan Xiang · Lixing Zhou · Xiaolei Wang · Xueli Ma · Wenwu Wang

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卷 59
期 3
页码 034002
IOP Publishing
ISSN: 0021-4922
DOI: 10.35848/1347-4065/ab7722

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