Effect of oxygen stoichiometry on the ferroelectric property of epitaxial all-oxide La[sub 0.7]Sr[sub 0.3]MnO[sub 3]/Pb(Zr[sub 0.52]Ti[sub 0.48])O[sub 3]/La[sub 0.7]Sr[sub 0.3]MnO[sub 3] thin-film capacitors - 吴文彬教授课题组 | LabXing

array(2) { ["lab"]=> string(2) "85" ["publication"]=> string(4) "1772" } Effect of oxygen stoichiometry on the ferroelectric property of epitaxial all-oxide La[sub 0.7]Sr[sub 0.3]MnO[sub 3]/Pb(Zr[sub 0.52]Ti[sub 0.48])O[sub 3]/La[sub 0.7]Sr[sub 0.3]MnO[sub 3] thin-film capacitors - 吴文彬教授课题组 | LabXing

吴文彬教授课题组

简介 Strongly Correlated Oxide Physics and Epitaxy Group

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Effect of oxygen stoichiometry on the ferroelectric property of epitaxial all-oxide La[sub 0.7]Sr[sub 0.3]MnO[sub 3]/Pb(Zr[sub 0.52]Ti[sub 0.48])O[sub 3]/La[sub 0.7]Sr[sub 0.3]MnO[sub 3] thin-film capacitors

2000

期刊 Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

作者 Wenbin Wu · K. H. Wong · C. L. Mak · C. L. Choy · Y. H. Zhang

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卷 18
期 5
页码 2412
American Vacuum Society
ISSN: 0734-2101
DOI: 10.1116/1.1288195

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