Temperature distribution measurement based on field-programmable gate array embedded ring oscillators

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "15263" } Temperature distribution measurement based on field-programmable gate array embedded ring oscillators - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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2019

期刊 Solid-State Electronics

作者 Wenjuan Yu · Shiwei Feng · Yamin Zhang · Bangbing Shi

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卷 158
页码 16-21
Elsevier BV
ISSN: 0038-1101
DOI: 10.1016/j.sse.2019.05.002

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