Novel Semiconductor Devices and Reliability Lab

Fatigue behavior of resistive switching in a BiFeO3 thin film

2018

期刊 Japanese Journal of Applied Physics

作者 Hui Zhu · Ying Yang · Anquan Jiang · Zilong Bai · Xiao Meng · Shiwei Feng

Junction Temperature Measurement Method for Power mosfets Using Turn-On Delay of Impulse Signal

2018

期刊 IEEE Transactions on Power Electronics

作者 Bangbing Shi · Shiwei Feng · Lei Shi · Dong Shi · Yamin Zhang · Hui Zhu

Junction Temperature measurement of SiC BJT via the voltage drop of V<inf>BC</inf>

2018

会议 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

作者 Bang-Bing Shi · Shi-Wei Feng · Quan-Bo He · Ya-Min Zhang · Kun Bai

Substrate thinning and external stress effect on the output characteristics of AlGaN/GaN HEMTs

2018

会议 2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC)

作者 Xiao Meng · Hui Zhu · Chen Wang · Ying Yang · Shiwei Feng · Yamin Zhang · Chunsheng Guo

Temperature distribution measurement for chips based on FPGA

2018

会议 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

作者 Wen-Juan Yu · Shi-Wei Feng · Shi-Jie Pan · Ya-Min Zhang · Bang-Bing Shi

A New Differential Amplitude Spectrum for Analyzing the Trapping Effect in GaN HEMTs Based on the Drain Current Transient

2017

期刊 IEEE Transactions on Electron Devices

作者 Xiang Zheng · Shiwei Feng · Yamin Zhang · Xin He · Yu Wang

Influence of heat source size on thermal resistance of AlGaN/GaN HEMT

2017

会议 2017 IEEE 12th International Conference on ASIC (ASICON)

作者 Chunsheng Guo · Ju Meng · Zhiheng Liao · Shiwei Feng · Xun Wang · Lin Luo

Monitoring of early catastrophic optical damage in laser diodes based on facet reflectivity measurement

2017

期刊 Applied Physics Letters

作者 S. Y. Zhang · S. W. Feng · Y. M. Zhang · Z. F. An · H. W. Yang · X. He · X Wang · Y. B. Qiao

Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test

2017

期刊 Microelectronics Journal

作者 Jingwei Li · Shiwei Feng · Yamin Zhang · Chao Wang · Xin He

Rapid test method for thermal characteristics of semiconductor devices

2017

会议 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)

作者 Shiwei Feng · Dong Shi · Xiang Zheng · Jingwei Li · Xin He · Yamin Zhang

Study of Heat Transport Behavior in GaN-Based Transistors by Schottky Characteristics Method

2017

期刊 IEEE Transactions on Electron Devices

作者 Yamin Zhang · Shiwei Feng · Hui Zhu · Chunsheng Guo · Yanbin Qiao · Jin Shao · Xiaodong Han

Analysis of the hybrid trapping effect in GaN HEMTS based on the current transient spectroscopy

2016

会议 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

作者 Xiang Zheng · Shiwei Feng · Yamin Zhang · Xin He · Yu Wang

Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures

2016

期刊 Applied Physics Letters

作者 Hui Zhu · Yingqiao Zhang · Anquan Jiang · Zilong Bai · Shiwei Feng · Pengfei Wang · Xiao Meng · Qiong Qi

Identifying the spatial position and properties of traps in GaN HEMTs using current transient spectroscopy

2016

期刊 Microelectronics Reliability

作者 Xiang Zheng · Shiwei Feng · Yamin Zhang · Junwei Yang

Thermal analysis in high power GaAs-based laser diodes

2016

期刊 Journal of Semiconductors

作者 Xueqin Gong · Shiwei Feng · Yuan Yue · Junwei Yang · Jingwei Li

All-digital thermal distribution measurement on field programmable gate array using ring oscillators

2015

期刊 Microelectronics Reliability

作者 Yuan Yue · Shi-Wei Feng · Chun-Sheng Guo · Xin Yan · Rui-Rui Feng

B13-P-01Temperature Characterization of Self-heating in GaN-based Transistors by Cathodeluminescence Spectroscopy

2015

期刊 Microscopy

作者 Li Wang · Yamin Zhang · Shiwei Feng · Yuan Ji · Xiaodong Han

Degradation Analysis of Facet Coating in GaAs-Based High-Power Laser Diodes

2015

期刊 IEEE Transactions on Device and Materials Reliability

作者 Xueqin Gong · Shiwei Feng · Hongwei Yang · Zhenfeng An · Yanbin Qiao

Degradation of the die attach layer in chip-on-board packaged light-emitting diodes during temperature cycling

2015

会议 2015 16th International Conference on Electronic Packaging Technology (ICEPT)

作者 Yan Xin · Feng Shiwei · Shi Dong · Yang Junwei

Measuring temperature in GaN-based high electron mobility transistors by cathodoluminescence spectroscopy

2015

期刊 Semiconductor Science and Technology

作者 Yamin Zhang · Shiwei Feng · Li Wang · Yuan Ji · Xiaodong Han · Lei Shi · Yan Zhao

Mechanism of the self-changing parameters and characteristics in AlGaN/GaN high-electron mobility transistors after a step voltage stress

2015

期刊 Journal of Semiconductors

作者 Lei Shi · Shiwei Feng · Kun Liu · Yamin Zhang

The research on temperature distribution of GaN-based blue laser diode

2015

期刊 Solid-State Electronics

作者 Dong Shi · Shiwei Feng · Yanbin Qiao · Pengyan Wen

Thermal investigation of LED array with multiple packages based on the superposition method

2015

期刊 Microelectronics Journal

作者 Dong Shi · Shiwei Feng · Yamin Zhang · Yanbin Qiao · Bing Deng

Thermal time-constant spectrum extraction method in AlGaN/GaN HEMTs

2015

期刊 Journal of Semiconductors

作者 Junwei Yang · Shiwei Feng · Dong Shi · Chunhui Yang

Variation of Dominant Degradation Mechanism in AlGaN Barrier Layer With Different Voltage Stress on the Gate of AlGaN/GaN High Electron Mobility Transistors

2015

期刊 IEEE Electron Device Letters

作者 Lei Shi · Shiwei Feng · Yamin Zhang · Bangbing Shi · Kun Liu

Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars

2014

期刊 IEEE Transactions on Electron Devices

作者 Yanbin Qiao · Shiwei Feng · Gongchang Zhang · Cong Xiong · Hui Zhu · Chunsheng Guo

Determining Drain Current Characteristics and Channel Temperature Rise in GaN HEMTs

2014

期刊 IEEE Transactions on Device and Materials Reliability

作者 Yamin Zhang · Shiwei Feng · Hui Zhu · Xueqin Gong · Lei Shi · Chunsheng Guo

Effect of Self-Heating on the Drain Current Transient Response in AlGaN/GaN HEMTs

2014

期刊 IEEE Electron Device Letters

作者 Yamin Zhang · Shiwei Feng · Hui Zhu · Chunsheng Guo · Bing Deng · Guangchen Zhang

Evaluation of the drain—source voltage effect on AlGaAs/InGaAs PHEMTs thermal resistance by the structure function method

2014

期刊 Journal of Semiconductors

作者 Lin Ma · Shiwei Feng · Yamin Zhang · Bing Deng · Yuan Yue

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

2014

期刊 Journal of Semiconductors

作者 Chunsheng Guo · Yanfeng Zhang · Ning Wan · Hui Zhu · Shiwei Feng

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Fatigue behavior of resistive switching in a BiFeO3 thin film

Junction Temperature Measurement Method for Power mosfets Using Turn-On Delay of Impulse Signal

Junction Temperature measurement of SiC BJT via the voltage drop of V<inf>BC</inf>

Substrate thinning and external stress effect on the output characteristics of AlGaN/GaN HEMTs

Temperature distribution measurement for chips based on FPGA

A New Differential Amplitude Spectrum for Analyzing the Trapping Effect in GaN HEMTs Based on the Drain Current Transient

Influence of heat source size on thermal resistance of AlGaN/GaN HEMT

Monitoring of early catastrophic optical damage in laser diodes based on facet reflectivity measurement

Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test

Rapid test method for thermal characteristics of semiconductor devices

Study of Heat Transport Behavior in GaN-Based Transistors by Schottky Characteristics Method

Analysis of the hybrid trapping effect in GaN HEMTS based on the current transient spectroscopy

Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures

Identifying the spatial position and properties of traps in GaN HEMTs using current transient spectroscopy

Thermal analysis in high power GaAs-based laser diodes

All-digital thermal distribution measurement on field programmable gate array using ring oscillators

B13-P-01Temperature Characterization of Self-heating in GaN-based Transistors by Cathodeluminescence Spectroscopy

Degradation Analysis of Facet Coating in GaAs-Based High-Power Laser Diodes

Degradation of the die attach layer in chip-on-board packaged light-emitting diodes during temperature cycling

Measuring temperature in GaN-based high electron mobility transistors by cathodoluminescence spectroscopy

Mechanism of the self-changing parameters and characteristics in AlGaN/GaN high-electron mobility transistors after a step voltage stress

The research on temperature distribution of GaN-based blue laser diode

Thermal investigation of LED array with multiple packages based on the superposition method

Thermal time-constant spectrum extraction method in AlGaN/GaN HEMTs

Variation of Dominant Degradation Mechanism in AlGaN Barrier Layer With Different Voltage Stress on the Gate of AlGaN/GaN High Electron Mobility Transistors

Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars

Determining Drain Current Characteristics and Channel Temperature Rise in GaN HEMTs

Effect of Self-Heating on the Drain Current Transient Response in AlGaN/GaN HEMTs

Evaluation of the drain—source voltage effect on AlGaAs/InGaAs PHEMTs thermal resistance by the structure function method

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions