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#Chaoxu Hu
Effects of gamma irradiation on GaN high-electron-mobility transistors characterized by the voltage-transient method
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
A new method for detecting heteromorphic workpiece brazing layer quality based on thermal probe
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Build-in compact and efficient temperature sensor array on field programmable gate array
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Analysis of the Effects of High-Energy Electron Irradiation of GaN High-Electron-Mobility Transistors Using the Voltage-Transient Method
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Low-cost reconfigurable temperature sensor array on field programmable gate array
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Non-destructive testing of heteromorphic workpiece brazing layer quality based on heat conduction
Novel Semiconductor Devices and Reliability Lab , 北京工业大学