#Junshuai Chai

Thermodynamic driving force of transient negative capacitance of ferroelectric capacitors

铁电器件课题组（王晓磊） , 中国科学院微电子研究所

Impact of Interlayer and Ferroelectric Materials on Charge Trapping During Endurance Fatigue of FeFET With TiN/HfₓZr₁₋ₓO₂/Interlayer/Si (MFIS) Gate Structure

铁电器件课题组（王晓磊） , 中国科学院微电子研究所

Experimental Extraction and Simulation of Charge Trapping During Endurance of FeFET With TiN/HfZrO/SiO2/Si (MFIS) Gate Structure

铁电器件课题组（王晓磊） , 中国科学院微电子研究所

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