#Zilong Bai

Fatigue behavior of resistive switching in a BiFeO3 thin film

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

A current transient method for trap analysis in BiFeO3 thin films

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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