该产品是世界上第一款可以对有机材料、基板、多孔材料、塑料以及高聚物材料等有电荷积累的样品和/或污染性样品进行超高分辨表征的低真空场发射扫描电子显微镜（FEG-SEM）。作为FEI公司引领市场的众多设备中最新的一员，Nova NanoSEM为用户在纳米研究、开发与生产的相关工作提供了更多的可能。
Nova NanoSEM的出现为那些非导电的以及有污染的纳米材料研究和开发者们带来了新的表征手段。与NanoSEM同时发布的FEI Helix探测技术将浸入式透镜和低真空扫描电镜两种技术成功地组合在一起，这在场发射扫描电镜的历史上还是第一次。在给用户带来超高分辨率的同时，还能在低真空环境下有效地抑制非导电材料的电荷积累效应。Nova NanoSEM的这种新技术还可以有效地抑制由前道样品处理过程所引起的电子束诱导污染。
除了低真空条件下二次电子和背散射电子成像以外，Nova NanoSEM还具有浸入式透镜的技术和FEI所特有的使用电子束进行纳米结构沉积的气体化学技术，所有的这些特点使之成为纳米结构与纳米材料研究领域中最先进、最理想的扫描电镜。
This product is the world's first low-vacuum field emission scanning electron microscope that can perform ultra-high resolution characterization of samples and / or contaminating samples such as organic materials, substrates, porous materials, plastics, and high polymer materials ( FEG-SEM). As the latest member of FEI's market-leading equipment, Nova NanoSEM provides users with more possibilities in nano research, development and production related work.
The emergence of Nova NanoSEM has brought new characterization methods to those non-conductive and contaminated nanomaterials researchers and developers. The FEI Helix detection technology released at the same time as NanoSEM successfully combined the two technologies of immersion lens and low vacuum scanning electron microscope. This is the first time in the history of field emission scanning electron microscope. While bringing ultra-high resolution to users, it can also effectively suppress the charge accumulation effect of non-conductive materials in a low vacuum environment. Nova NanoSEM's new technology can also effectively suppress electron beam-induced contamination caused by the previous sample processing process.
In addition to secondary electron and backscattered electron imaging under low vacuum conditions, Nova NanoSEM also has immersion lens technology and FEI's unique gas chemistry technology that uses electron beams for nanostructure deposition. All these features make it a nanostructure The most advanced and ideal scanning electron microscope in the field of nanomaterials research.
