array(2) { ["lab"]=> string(4) "1537" ["publication"]=> string(5) "14270" } Layout-Aware Variability Characterization of CMOS Current Sources - 河科大电子系 IC课题组 | LabXing

Layout-Aware Variability Characterization of CMOS Current Sources

2012
期刊 IEICE Transactions on Electronics
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  • 卷 E95.C
  • 期 4
  • 页码 696-705
  • Institute of Electronics, Information and Communications Engineers (IEICE)
  • ISSN: 0916-8524
  • DOI: 10.1587/transele.e95.c.696