array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "14589" } Measuring Junction Temperature Inhomogeneity of Double-chip IGBT Modules by Electrical Method - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Measuring Junction Temperature Inhomogeneity of Double-chip IGBT Modules by Electrical Method

2020
会议 2020 3rd International Conference on Electron Device and Mechanical Engineering (ICEDME)
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