Thermal time-constant spectrum extraction method in AlGaN/GaN HEMTs

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6240" } Thermal time-constant spectrum extraction method in AlGaN/GaN HEMTs - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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2015

期刊 Journal of Semiconductors

作者 Junwei Yang · Shiwei Feng · Dong Shi · Chunhui Yang

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卷 36
期 8
页码 084003
IOP Publishing
ISSN: 1674-4926
DOI: 10.1088/1674-4926/36/8/084003

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