#Yuan Yue

All-digital thermal distribution measurement on field programmable gate array using ring oscillators

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Evaluation of the drain—source voltage effect on AlGaAs/InGaAs PHEMTs thermal resistance by the structure function method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Transient thermal characteristics related to catastrophic optical damage in high power AlGaAs/GaAs laser diodes

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Thermal analysis in high power GaAs-based laser diodes

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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