Analysis of degradation of GaN-Based light-emitting diodes - Novel Semiconductor Devices and Reliability Lab | LabXing

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "14594" } Analysis of degradation of GaN-Based light-emitting diodes - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Analysis of degradation of GaN-Based light-emitting diodes

2009

会议 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

作者 Lu Wang · Shiwei Feng · Chunsheng Guo · Guangchen Zhang

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IEEE
DOI: 10.1109/ipfa.2009.5232606

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