array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "15262" } B13-P-01Temperature Characterization of Self-heating in GaN-based Transistors by Cathodeluminescence Spectroscopy - Novel Semiconductor Devices and Reliability Lab | LabXing

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B13-P-01Temperature Characterization of Self-heating in GaN-based Transistors by Cathodeluminescence Spectroscopy

2015
期刊 Microscopy
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  • 卷 64
  • 期 suppl 1
  • 页码 i93.1-i93
  • Oxford University Press (OUP)
  • ISSN: 2050-5698
  • DOI: 10.1093/jmicro/dfv236
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