Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6263" } Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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2014

期刊 Journal of Semiconductors

作者 Chunsheng Guo · Yanfeng Zhang · Ning Wan · Hui Zhu · Shiwei Feng

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卷 35
期 8
页码 084010
IOP Publishing
ISSN: 1674-4926
DOI: 10.1088/1674-4926/35/8/084010

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