首页
(current)
大学
论文
新闻
招聘
FAQ
简体中文
中
En
登录
注册
#Hao Xu
Elaborately Designed Hierarchical Heterostructures Consisting of Carbon-Coated TiO2(B) Nanosheets Decorated with Fe3O4Nanoparticles for Remarkable Synergy in High-Rate Lithium Storage
Xie Group , 清华大学
Point-of-Care Tissue Analysis Using Miniature Mass Spectrometer
瑕瑜研究组-自由基生物质谱 , 清华大学
Thermodynamic driving force of transient negative capacitance of ferroelectric capacitors
铁电器件课题组(王晓磊) , 中国科学院微电子研究所
Impact of Interlayer and Ferroelectric Materials on Charge Trapping During Endurance Fatigue of FeFET With TiN/HfₓZr₁₋ₓO₂/Interlayer/Si (MFIS) Gate Structure
铁电器件课题组(王晓磊) , 中国科学院微电子研究所
Experimental Extraction and Simulation of Charge Trapping During Endurance of FeFET With TiN/HfZrO/SiO2/Si (MFIS) Gate Structure
铁电器件课题组(王晓磊) , 中国科学院微电子研究所
Depolarization Field in FeFET Considering Minor Loop Operation and Charge Trapping
铁电器件课题组(王晓磊) , 中国科学院微电子研究所
Impact of mobility degradation on endurance fatigue of FeFET with TiN/Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>/SiO<sub>x</sub>/Si (MFIS) gate structure
铁电器件课题组(王晓磊) , 中国科学院微电子研究所
Trap Generation in Whole Gate Stacks of FeFET With TiN/Hf$_\text{0.5}$Zr$_\text{0.5}$O$_\text{2}$/SiO$_{\textit{x}}$/Si (MFIS) Gate Structure During Endurance Fatigue
铁电器件课题组(王晓磊) , 中国科学院微电子研究所
Trap characteristics of hafnium oxide-based ferroelectric field-effect transistors measured by using a current transient method
Novel Semiconductor Devices and Reliability Lab , 北京工业大学