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#Jingwei Li
Evaluation of the Schottky Contact Degradation on the Temperature Transient Measurements in GaN HEMTs
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Thermal analysis in high power GaAs-based laser diodes
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Rapid test method for thermal characteristics of semiconductor devices
Novel Semiconductor Devices and Reliability Lab , 北京工业大学