Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6233" } Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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2017

期刊 Microelectronics Journal

作者 Jingwei Li · Shiwei Feng · Yamin Zhang · Chao Wang · Xin He

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卷 60
页码 55-59
Elsevier BV
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2016.11.013

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