#Na Xie

Study of traps in low-temperature polysilicon thin film transistors using a current transient method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Strain distribution and electrical characteristics of flexible low-temperature polysilicon thin film transistors under biaxial bending

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Research on the Wake-up Effect of Ferroelectric HfO2-ZrO2 Thin Films

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Effects of Static and Repetitive Uniaxial Bending Strains on the Electrical Properties and Trap Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Wake-up effect in Hf<sub>0.4</sub>Zr<sub>0.6</sub>O<sub>2</sub> ferroelectric thin-film capacitors under a cycling electric field

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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