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#Xiao Meng
Effect of post-deposition annealing pressure on bipolar resistive switching in RF sputtered BiFeO<inf>3</inf>/Nb:SrTiO<inf>3</inf> heterostructure
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Bipolar Resistive Switching Effect in BiFeO3/Nb:SrTiO3 Heterostructure by RF Sputtering at Room Temperature
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Substrate thinning and external stress effect on the output characteristics of AlGaN/GaN HEMTs
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Fatigue behavior of resistive switching in a BiFeO3 thin film
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
A current transient method for trap analysis in BiFeO3 thin films
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Effect of substrate thinning on the electronic transport characteristics of AlGaN/GaN HEMTs
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures
Novel Semiconductor Devices and Reliability Lab , 北京工业大学