Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures - Novel Semiconductor Devices and Reliability Lab | LabXing

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6237" } Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures

2016

期刊 Applied Physics Letters

作者 Hui Zhu · Yingqiao Zhang · Anquan Jiang · Zilong Bai · Shiwei Feng · Pengfei Wang · Xiao Meng · Qiong Qi

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卷 109
期 25
页码 252901
AIP Publishing
ISSN: 0003-6951
DOI: 10.1063/1.4972302

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