Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits - 单粒子效应研究组 | LabXing

array(2) { ["lab"]=> string(4) "1176" ["publication"]=> string(4) "9752" } Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits - 单粒子效应研究组 | LabXing

单粒子效应研究组

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Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits

2019

期刊 IEICE Electronics Express

作者 Liewei Xu · Chang Cai · Tianqi Liu · Lingyun Ke · Jun Yu · Chang Wu

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卷 16
期 10
页码 20190196-20190196
Institute of Electronics, Information and Communications Engineers (IEICE)
ISSN: 1349-2543
DOI: 10.1587/elex.16.20190196

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