Effect of Surface Roughness on Thermal Contact Resistance of Fixed Interface in Thermal Measurement of Electron Device - Novel Semiconductor Devices and Reliability Lab | LabXing

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "14481" } Effect of Surface Roughness on Thermal Contact Resistance of Fixed Interface in Thermal Measurement of Electron Device - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Effect of Surface Roughness on Thermal Contact Resistance of Fixed Interface in Thermal Measurement of Electron Device

2020

会议 2020 3rd International Conference on Electron Device and Mechanical Engineering (ICEDME)

作者 Yuzheng Chen · Shiwei Feng · Yamin Zhang · Xin He · Kun Bai · Xuan Li

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IEEE
DOI: 10.1109/icedme50972.2020.00017

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