array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "14825" } Experimental investigation on dipole and band offset affected by charge neutrality level modulation - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Experimental investigation on dipole and band offset affected by charge neutrality level modulation

2022
期刊 Applied Physics A
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