array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6257" } Quick screen of thermal resistance for batching high brightness LEDs - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

大学 北京工业大学 / 信息学部
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Quick screen of thermal resistance for batching high brightness LEDs

2012
会议 2012 Power Engineering and Automation Conference
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