Supply voltage dependence of single event upset sensitivity in diverse SRAM devices
2014
会议
2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)
作者
Zhangang Zhang
· Jie Liu
· Youmei Sun
· Mingdong Hou
· Teng Tong
· Song Gu
· Tianqi Liu
· Chao Geng
· Kai Xi
· Huijun Yao
· Jie Luo
· Jinglai Duan
· Dan Mo
· Hong Su
· Zhifeng Lei
· Yunfei En
· Yun Huang
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- IEEE
- ISBN: 9781479966325
- DOI: 10.1109/icrms.2014.7107149