贾新培博士的IEEE TED文章发表
06.05.2022
恭喜贾新培博士的文章“Depolarization Field in FeFET Considering Minor Loop Operation and Charge Trapping”发表在IEEE TED上
赵淑景硕士的IEEE TED文章发表
04.03.2022
恭喜赵淑景硕士的文章“Experimental Extraction and Simulation of Charge Trapping During Endurance of FeFET With TiN/HfZrO/SiO2/Si (MFIS) Gate Structure”发表在IEEE TED上
田凤彬博士的的IEEE TED文章发表
18.11.2021
恭喜田凤彬博士的文章“Impact of Interlayer and Ferroelectric Materials on Charge Trapping during Endurance Fatigue of FeFET with TiN/HfxZr1-xO2/interlayer/Si (MFIS) Gate Structure”发表在IEEE TED杂志上
欢迎新成员加入
27.08.2021
欢迎 贾新培、邵宪周、戴塞飞、廖敏、徐双双、李宋伟6人从国科大回到微电子所，开展研究工作
孙晓清博士的IEEE TED文章发表
15.08.2021
恭喜孙晓清博士的文章“The effect of interface traps at the Si/SiO2 interface on the transient negative capacitance of ferroelectric FETs”发表在IEEE TED杂志上
张元元博士的APL文章发表
13.07.2021
恭喜张元元博士的文章“Thermodynamic driving force of transient negative capacitance of ferroelectric capacitors”发表在APL杂志上