array(2) { ["lab"]=> string(4) "1352" ["publication"]=> string(5) "11882" } Identification of a suitable passivation route for high-k/SiGe interface based on ozone oxidation - 铁电器件课题组(王晓磊) | LabXing

Identification of a suitable passivation route for high-k/SiGe interface based on ozone oxidation

2019
期刊 Applied Surface Science
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